High-accuracy measurements of the quantum anomalous Hall effect for resistance metrology

authored by: Dinesh K. Patel, Mattias Kruskopf, Kajetan M. Fijalkowski, Martin Gotz, Eckart Pesel, Marcelo Jaime, Hansjorg Scherer, Steffen Schreyeck, Karl Brunner, Charles Gould, Laurens W. Molenkamp
Abstract: This study explores the quantum anomalous Hall effect (QAHE) in V-doped (BiSb)2Te3, a magnetically-doped topological insulators. We use a precision resistance bridge based on a cryogenic current comparator to measure the QAHE at a zero magnetic field with unprecedented uncertainty (ΔRxy/RK ≤ 12 nΩ/Ω). Measurement results obtained at currents between 40 and 300 nA demonstrate the potential of this technology for quantum metrology, offering a path to a primary electrical resistance standard without external magnetic fields.
External Organisation(s): Physikalisch-Technische Bundesanstalt PTB
Julius Maximilian University of Würzburg
Type: Conference contribution
Publication date: 12.07.2024
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Electronic, Optical and Magnetic Materials, Instrumentation, Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.1109/cpem61406.2024.10646071 (Access: Closed)

BibTeX

@inproceedings{6aeeee48cdc8485a8e1cff14b5ee778d,
title = "High-accuracy measurements of the quantum anomalous Hall effect for resistance metrology",
abstract = "This study explores the quantum anomalous Hall effect (QAHE) in V-doped (BiSb)2Te3, a magnetically-doped topological insulators. We use a precision resistance bridge based on a cryogenic current comparator to measure the QAHE at a zero magnetic field with unprecedented uncertainty (ΔRxy/RK ≤ 12 nΩ/Ω). Measurement results obtained at currents between 40 and 300 nA demonstrate the potential of this technology for quantum metrology, offering a path to a primary electrical resistance standard without external magnetic fields.",
keywords = "Hall effect devices, metrology, topological insulators",
author = "Patel, {Dinesh K.} and Mattias Kruskopf and Fijalkowski, {Kajetan M.} and Martin Gotz and Eckart Pesel and Marcelo Jaime and Hansjorg Scherer and Steffen Schreyeck and Karl Brunner and Charles Gould and Molenkamp, {Laurens W.}",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; Conference date: 08-07-2024 Through 12-07-2024",
year = "2024",
month = jul,
day = "12",
doi = "10.1109/cpem61406.2024.10646071",
language = "English",
series = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 Conference on Precision Electromagnetic Measurements, CPEM 2024 - Proceedings",
address = "United States",
}