Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope

authored by

P. J. Ritter, M. Tollkuehn, M. Schilling, B. Hampel

Abstract

Terahertz (THz) gas lasers produce high output powers and can emit radiation at several lines with different lasing mediums. Often emission of multiple frequencies occurs with one lasing medium, which cannot be spectroscopically resolved with a thermal sensor. Our THz microscope employs a Josephson cantilever as a sensor, which relies on the Josephson effect. Thus, the sensor can record the incident spectrum. Additionally, the sensor can be moved during measurements. Hence, our setup enables the spectroscopic and spatial evaluation of multi-frequency far-infrared laser emission in one measurement. In this work, we present measurements of multiple laser lines, which are simultaneously recorded at frequencies between 1 THz and 1.4 THz.

Type

Conference contribution

Publication date

2022

Publication status

Published

ASJC Scopus subject areas

Energy Engineering and Power Technology, Electrical and Electronic Engineering

Electronic version(s)

https://doi.org/10.1109/irmmw-thz50927.2022.9895908 (Access: Closed)