Characterization of Multi-Frequency Emission of Far-Infrared Laser with Josephson Junctions in a THz Microscope

verfasst von

P. J. Ritter, M. Tollkuehn, M. Schilling, B. Hampel

Abstract

Terahertz (THz) gas lasers produce high output powers and can emit radiation at several lines with different lasing mediums. Often emission of multiple frequencies occurs with one lasing medium, which cannot be spectroscopically resolved with a thermal sensor. Our THz microscope employs a Josephson cantilever as a sensor, which relies on the Josephson effect. Thus, the sensor can record the incident spectrum. Additionally, the sensor can be moved during measurements. Hence, our setup enables the spectroscopic and spatial evaluation of multi-frequency far-infrared laser emission in one measurement. In this work, we present measurements of multiple laser lines, which are simultaneously recorded at frequencies between 1 THz and 1.4 THz.

Typ

Aufsatz in Konferenzband

Publikationsdatum

2022

Publikationsstatus

Veröffentlicht

ASJC Scopus Sachgebiete

Energieanlagenbau und Kraftwerkstechnik, Elektrotechnik und Elektronik

Elektronische Version(en)

https://doi.org/10.1109/irmmw-thz50927.2022.9895908 (Zugang: Geschlossen)