Quantum calibrated magnetic force microscopy

authored by
Baha Sakar, Yan Liu, Sibylle Sievers, Volker Neu, Johannes Lang, Christian Osterkamp, Matthew L. Markham, Osman Öztürk, Fedor Jelezko, Hans W. Schumacher
Abstract

We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.

External Organisation(s)
National Metrology Institute of Germany (PTB)
Gebze Technical University
Beijing Academy of Quantum Information Sciences
Ulm University
Leibniz Institute for Solid State and Materials Research Dresden (IFW)
Element Six Global Innovation Centre (GIC)
Type
Article
Journal
Physical Review B
Volume
104
ISSN
2469-9950
Publication date
01.12.2021
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Condensed Matter Physics
Electronic version(s)
https://doi.org/10.1103/PhysRevB.104.214427 (Access: Unknown)