Integrated Atomic Quantum Technologies in Demanding Environments:: Development and Qualification of Miniaturized Optical Setups and Integration Technologies for UHV and Space Operation

authored by
M. Christ, Alexander Kassner, R. Smol, Ahmad Ibrahim Bawamia, Achim Peters, Marc Christopher Wurz, Ernst Maria Rasel, Andreas Wicht, Markus Krutzik
Abstract

Employing compact quantum sensors in field or in space (e.g., small satellites) implies demanding requirements on components and integration technologies. Within our work on integrated sensors, we develop miniaturized, ultra-stable optical setups for optical cooling and trapping of cold atomic gases. Besides challenging demands on alignment precision, and thermo-mechanical durability, we specifically address ultra-high vacuum (UHV) compatibility of our integration technologies and optical components. A prototype design of an UHV-compatible, crossed beam optical dipole trap setup and its application within a cold atomic quantum sensor is described. First qualification efforts on adhesive micro-integration technologies are presented. These tests are conducted in application-relevant geometries and material combinations common for micro-integrated optical setups. Adhesive aging will be investigated by thermal cycling or gamma radiation exposure. For vacuum compatibility testing, a versatile UHV testing system is currently being set up, enabling residual gas analysis and measurement of total gas rates down to 5•10-10mbar l/s at a base pressure of 10-11 mbar, exceeding the common ASTM E595 test.

Organisation(s)
QuantumFrontiers
Institute of Microtechnology
Institute of Quantum Optics
External Organisation(s)
Humboldt-Universität zu Berlin (HU Berlin)
Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik (FBH)
Type
Conference contribution
No. of pages
8
Publication date
12.07.2019
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Computer Science Applications, Applied Mathematics, Electrical and Electronic Engineering
Electronic version(s)
https://doi.org/10.1117/12.2536215 (Access: Open)