Josephson cantilevers for THz microscopy of additive manufactured diffractive optical components

verfasst von: Benedikt Hampel, Marco Tollkuhn, Ilya Elenskiy, Michael Martens, Denis Kajevic, Meinhard Schilling
Abstract: Josephson junctions can be employed as sensors to determine frequency and power of microwave and terahertz (THz) radiation. A Josephson cantilever carries at least one Josephson junction with an antenna structure to be sensitive for THz radiation. In our THz microscope, this cantilever is mounted on a 15 × 15 × 15 mm3 positioning system in vacuum and is cooled by a cryocooler to operating temperatures between 30 and 85 K. Current-voltage characteristics are measured at every spatial position. The frequency and power of THz radiation are derived from the electrical characteristics for every spatial point and three-dimensional visualizations of the power distribution are evaluated. The THz microscope represents a versatile measuring instrument to characterize many different microwave and THz circuits and components. In this paper, Josephson cantilevers fromYBa2Cu3O7 on LaAlO3 bicrystal substrates are employed to characterize additive manufactured diffraction gratings. The diffraction patterns of the gratings are measured and visualized with a far-infrared laser system at a frequency of 762 GHz. The obtained results are matching with calculations from a theoretical model. The presented method is capable of supporting fast prototyping processes for THz components by analyzing diffraction patterns three dimensionally.
Externe Organisation(en): Technische Universität Braunschweig
Typ: Artikel
Journal: IEEE Transactions on Applied Superconductivity
Band: 29
ISSN: 1051-8223
Publikationsdatum: 30.01.2019
Publikationsstatus: Veröffentlicht
Peer-reviewed: Ja
ASJC Scopus Sachgebiete: Elektronische, optische und magnetische Materialien, Physik der kondensierten Materie, Elektrotechnik und Elektronik
Elektronische Version(en): https://doi.org/10.1109/tasc.2019.2896153 (Zugang: Geschlossen)

BibTeX

@article{8323b2c8247e4345a823e873ee3eaf24,
title = "Josephson cantilevers for THz microscopy of additive manufactured diffractive optical components",
abstract = "Josephson junctions can be employed as sensors to determine frequency and power of microwave and terahertz (THz) radiation. A Josephson cantilever carries at least one Josephson junction with an antenna structure to be sensitive for THz radiation. In our THz microscope, this cantilever is mounted on a 15 × 15 × 15 mm3 positioning system in vacuum and is cooled by a cryocooler to operating temperatures between 30 and 85 K. Current-voltage characteristics are measured at every spatial position. The frequency and power of THz radiation are derived from the electrical characteristics for every spatial point and three-dimensional visualizations of the power distribution are evaluated. The THz microscope represents a versatile measuring instrument to characterize many different microwave and THz circuits and components. In this paper, Josephson cantilevers fromYBa2Cu3O7 on LaAlO3 bicrystal substrates are employed to characterize additive manufactured diffraction gratings. The diffraction patterns of the gratings are measured and visualized with a far-infrared laser system at a frequency of 762 GHz. The obtained results are matching with calculations from a theoretical model. The presented method is capable of supporting fast prototyping processes for THz components by analyzing diffraction patterns three dimensionally.",
keywords = "diffraction gratings, HTS, Josephson cantilever, THz microscope, YBCO",
author = "Benedikt Hampel and Marco Tollkuhn and Ilya Elenskiy and Michael Martens and Denis Kajevic and Meinhard Schilling",
note = "Funding Information: Manuscript received October 30, 2018; accepted January 17, 2019. Date of publication January 30, 2019; date of current version February 22, 2019. This work was supported in part by the Braunschweig International Graduate School of Metrology B-IGSM, in part by the DFG Research Training Group GrK 1952/1 Metrology for Complex Nanosystems, in part by the Laboratory for Emerging Nanometrology, in part by the Cluster of Excellence—Quantum Frontiers, and in part by the Young Researcher Program of MWK, federal state Lower Saxony, Germany. (Corresponding author: Benedikt Hampel.) The authors are with the Institut f{\"u}r Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany (e-mail:, b.hampel@tu-bs.de).",
year = "2019",
month = jan,
day = "30",
doi = "10.1109/tasc.2019.2896153",
language = "English",
volume = "29",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",
}